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Proceedings Paper

Luminescence of nanostructured Y2O3:Eu thin films fabricated using glancing angle deposition techniques
Author(s): Peter C. P. Hrudey; Mike Taschuk; Ying Y. Tsui; Robert Fedosejevs; Jeremy C. Sit; Michael J. Brett
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Paper Abstract

Thin films of europium-doped yttrium oxide (Y2O3:Eu), a well-known luminescent material, were grown using electron beam evaporation, in combination with the Glancing Angle Deposition (GLAD) technique. GLAD makes use of controlled substrate motion during physical vapour deposition (PVD), resulting in a high degree of control over the nanostructure of the film. Until recently GLAD had not been used with luminescent materials. Films were deposited using pre-doped Y2O3:Eu source material, with either 4.0% (wt) Eu doping or 5.6% (wt) Eu doping. The nanostructure of these films was characterized through scanning electron microscopy, while the light emission properties of these films was characterized by photoluminescence measurements. In order to optimize the light emission properties of the films the partial pressure of oxygen during the deposition of the films was varied. Films were deposited on both silicon and sapphire substrates, in order to compare how different substrates affect the growth and light emission of the films.

Paper Details

Date Published: 24 November 2003
PDF: 8 pages
Proc. SPIE 5224, Nanomaterials and Their Optical Applications, (24 November 2003); doi: 10.1117/12.506266
Show Author Affiliations
Peter C. P. Hrudey, Univ. of Alberta (Canada)
Mike Taschuk, Univ. of Alberta (Canada)
Ying Y. Tsui, Univ. of Alberta (Canada)
Robert Fedosejevs, Univ. of Alberta (Canada)
Jeremy C. Sit, Univ. of Alberta (Canada)
Michael J. Brett, Univ. of Alberta (Canada)


Published in SPIE Proceedings Vol. 5224:
Nanomaterials and Their Optical Applications
Guozhong Cao; Younan Xia; Paul V. Braun, Editor(s)

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