Share Email Print
cover

Proceedings Paper

Wavelets, curvelets, and multiresolution analysis techniques in fast Z-pinch research
Author(s): Bedros Afeyan; Kirk Won; Jean-Luc Starck; Michael Cuneo
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Z pinches produce an X ray rich plasma environment where backlighting imaging of imploding targets can be quite challenging to analyze. What is required is a detailed understanding of the implosion dynamics by studying snapshot images of its in flight deformations away from a spherical shell. We have used wavelets, curvelets and multiresolution analysis techniques to address some of these difficulties and to establish the Shell Thickness Averaged Radius (STAR) of maximum density, r*(N,θ) where N is the percentage of the shell thickness over which we average. The non-uniformities of r*(N,θ) are quantified by a Legendre polynomial decomposition in angle, θ, and the identification of its largest coefficients. Undecimated wavelet decompositions outperform decimated ones in denoising and both are surpassed by the curvelet transform. In each case, hard thresholding based on noise modeling is used.

Paper Details

Date Published: 13 November 2003
PDF: 11 pages
Proc. SPIE 5207, Wavelets: Applications in Signal and Image Processing X, (13 November 2003); doi: 10.1117/12.506243
Show Author Affiliations
Bedros Afeyan, Polymath Research Inc. (United States)
Kirk Won, Polymath Research Inc. (United States)
Jean-Luc Starck, CEA Saclay (France)
Michael Cuneo, Sandia National Labs. (United States)


Published in SPIE Proceedings Vol. 5207:
Wavelets: Applications in Signal and Image Processing X
Michael A. Unser; Akram Aldroubi; Andrew F. Laine, Editor(s)

© SPIE. Terms of Use
Back to Top