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Proceedings Paper

X-ray performance of gratings in the extreme off-plane mount
Author(s): Randall Lee McEntaffer; Steve N. Osterman; Webster C. Cash; John Gilchrist; Jean Flamand; Bruno Touzet; Fransis Bonnemason; Christian Brach
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Paper Abstract

High groove density reflection gratings placed at grazing incidence in the extreme off-plane mount offer increased performance over conventional in-plane mounts in the x-ray. We present initial off-plane efficiency test results from the grating evaluation facility at the University of Colorado. The test gratings are holographically ruled, ion-etched gratings with radial groove profiles that were developed and fabricated by Jobin-Yvon Inc.

Paper Details

Date Published: 29 January 2004
PDF: 7 pages
Proc. SPIE 5168, Optics for EUV, X-Ray, and Gamma-Ray Astronomy, (29 January 2004); doi: 10.1117/12.506200
Show Author Affiliations
Randall Lee McEntaffer, Univ. of Colorado/Boulder (United States)
Steve N. Osterman, Univ. of Colorado/Boulder (United States)
Webster C. Cash, Univ. of Colorado/Boulder (United States)
John Gilchrist, Jobin-Yvon Inc. (United States)
Jean Flamand, Jobin-Yvon SAS (France)
Bruno Touzet, Jobin-Yvon SAS (France)
Fransis Bonnemason, Jobin-Yvon SAS (France)
Christian Brach, Jobin-Yvon SAS (France)

Published in SPIE Proceedings Vol. 5168:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy
Oberto Citterio; Stephen L. O'Dell, Editor(s)

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