Share Email Print
cover

Proceedings Paper

X-ray laser-induced time-of-flight photoelectron spectroscopy
Author(s): Art J. Nelson; James Dunn; Tony W. van Buuren; Jim Hunter; Ray F. Smith; Oliver Hemmers; Dennis W. Lindle
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

X-ray laser induced time-of-flight photoelectron spectroscopy has been used to probe the core-level and valence band electronic structure of room-temperature bulk materials with picosecond time resolution. The LLNL COMET compact tabletop x-ray laser source provides the necessary high photon flux, high energy, monochromaticity, picosecond pulse duration, and coherence for probing ultrafast changes in the chemical and electronic structure of these materials. Valence band and core-level spectra were recorded for transition metal surfaces. In situ sputter etching with Ar ions at 30° incidence will be implemented to improve the surface purity and consequently increase core-level and valence-band photoemission intensity. This work demonstrates a powerful new technique for probing reaction dynamics and for probing changes of local order on surfaces on their fundamental timescales. Future work will include the study of fundamental phenomena such as non-thermal melting, chemical bond formation, intermediate reaction steps, and the existence of transient reaction products.

Paper Details

Date Published: 19 December 2003
PDF: 6 pages
Proc. SPIE 5197, Soft X-Ray Lasers and Applications V, (19 December 2003); doi: 10.1117/12.506162
Show Author Affiliations
Art J. Nelson, Lawrence Livermore National Lab. (United States)
James Dunn, Lawrence Livermore National Lab. (United States)
Tony W. van Buuren, Lawrence Livermore National Lab. (United States)
Jim Hunter, Lawrence Livermore National Lab. (United States)
Ray F. Smith, Lawrence Livermore National Lab. (United States)
Oliver Hemmers, Univ. of Nevada/Las Vegas (United States)
Dennis W. Lindle, Univ. of Nevada/Las Vegas (United States)


Published in SPIE Proceedings Vol. 5197:
Soft X-Ray Lasers and Applications V
Ernst E. Fill; Szymon Suckewer, Editor(s)

© SPIE. Terms of Use
Back to Top