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Proceedings Paper

Optical constants for hard x-ray multilayers over the energy range E = 35 – 180 keV
Author(s): David L. Windt; Soizik Donguy; Charles J. Hailey; Jason E. Koglin; Veijo Honkimaki; Eric Ziegler; Finn E. Christensen; Fiona A. Harrison
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Paper Abstract

We have determined experimentally optical constants for eight thin film materials that can be used in hard X-ray multilayer coatings. Thin film samples of Ni.97V.03, Mo, W, Pt, C, B4C, Si and SiC were deposited by magnetron sputtering onto superpolished optical flats. Optical constants were determined from fits to reflectance-vs-incidence angle measurements made using synchrotron radiation over the energy range E=35-180 keV. We have also measured the X-ray reflectance of a prototype W/SiC multilayer coating over the energy range E=35-100 keV, and we compare the measured reflectance with a calculation using the newly derived optical constants.

Paper Details

Date Published: 29 January 2004
PDF: 6 pages
Proc. SPIE 5168, Optics for EUV, X-Ray, and Gamma-Ray Astronomy, (29 January 2004); doi: 10.1117/12.505886
Show Author Affiliations
David L. Windt, Columbia Univ. (United States)
Soizik Donguy, Columbia Univ. (United States)
Charles J. Hailey, Columbia Univ. (United States)
Jason E. Koglin, Columbia Univ. (United States)
Veijo Honkimaki, European Synchrotron Radiation Facility (France)
Eric Ziegler, European Synchrotron Radiation Facility (France)
Finn E. Christensen, Danish Space Research Institute (Denmark)
Fiona A. Harrison, California Institute of Technology (United States)

Published in SPIE Proceedings Vol. 5168:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy
Oberto Citterio; Stephen L. O'Dell, Editor(s)

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