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Proceedings Paper

Characterization of polarization aberrations in liquid crystal devices
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Paper Abstract

Reflective Liquid Crystal on Silicon (LCoS) panels are widely used as light valves for projection displays. LCoS panels and the associated beam splitters, retardance films, and dichroic beam splitters display significant variations in polarization properties over the area, angle of incidence and spectral bandwidth of the projector. This paper surveys these polarization aberrations and describes a high speed Mueller Matrix Imaging Polarimeter (MMIP) for the characterization of these polarization aberrations. The characterization of projection systems and components by the MMIP enables advanced modeling and compensation of polarization aberrations.

Paper Details

Date Published: 4 November 2003
PDF: 5 pages
Proc. SPIE 5188, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies, (4 November 2003); doi: 10.1117/12.505871
Show Author Affiliations
Justin Wolfe, Optical Sciences Ctr./Univ. of Arizona (United States)
Russell Chipman, Optical Sciences Ctr./Univ. of Arizona (United States)


Published in SPIE Proceedings Vol. 5188:
Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies
Angela Duparre; Bhanwar Singh, Editor(s)

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