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Proceedings Paper

Soft x-ray resonant magnetic scattering study of thin films and multilayers
Author(s): Chi-Chang Kao; Erik D. Johnson; Jerome B. Hastings; D. Peter Siddons; Christian Vettier
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Paper Abstract

A brief review of using soft x-ray resonant magnetic scattering in the study of magnetic thin films and multilayers is given. Results from recent studies of thin Fe films and Fe/Gd multilayers are used as examples to demonstrate the information that can be obtained and the unique features of this technique. Comparison is made with related techniques: magneto- optical Kerr effect, Faraday effect, and magnetic circular dichroism.

Paper Details

Date Published: 1 November 1991
PDF: 9 pages
Proc. SPIE 1548, Production and Analysis of Polarized X Rays, (1 November 1991); doi: 10.1117/12.50580
Show Author Affiliations
Chi-Chang Kao, Brookhaven National Lab. (United States)
Erik D. Johnson, Brookhaven National Lab. (United States)
Jerome B. Hastings, Brookhaven National Lab. (United States)
D. Peter Siddons, Brookhaven National Lab. (United States)
Christian Vettier, European Synchrotron Radiation Facility (France)


Published in SPIE Proceedings Vol. 1548:
Production and Analysis of Polarized X Rays
D. Peter Siddons, Editor(s)

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