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Proceedings Paper

Advances in CCD technology for x-ray diffraction applications
Author(s): Timothy A. Thorson; Roger D. Durst; Dan Frankel; Rex L. Bordwell; Jose R. Camara; Edward Leon-Guerrero; Steven K. Onishi; Francis Pang; Paul Vu; Edwin M Westbrook
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Paper Abstract

Phosphor-coupled CCDs are established as one of the most successful technologies for x-ray diffraction. This application demands that the CCD simultaneously achieve both the highest possible sensitivity and high readout speeds. Recently, wafer-scale, back illuminated devices have become available which offer significantly higher quantum efficiency than conventional devices (the Fairchild Imaging CCD 486 BI). However, since back thinning significantly changes the electrical properties of the CCD the high speed operation of wafer-scale, back-illuminated devices is not well understood. Here we describe the operating characteristics (including noise, linearity, full well capacity and CTE) of the back-illuminated CCD 486 at readout speeds up to 4 MHz.

Paper Details

Date Published: 20 January 2004
PDF: 9 pages
Proc. SPIE 5198, Hard X-Ray and Gamma-Ray Detector Physics V, (20 January 2004); doi: 10.1117/12.505710
Show Author Affiliations
Timothy A. Thorson, Bruker-AXS Inc. (United States)
Roger D. Durst, Bruker-AXS Inc. (United States)
Dan Frankel, Bruker-AXS Inc. (United States)
Rex L. Bordwell, Fairchild Imaging (United States)
Jose R. Camara, Fairchild Imaging (United States)
Edward Leon-Guerrero, Fairchild Imaging (United States)
Steven K. Onishi, Fairchild Imaging (United States)
Francis Pang, Fairchild Imaging (United States)
Paul Vu, Fairchild Imaging (United States)
Edwin M Westbrook, Molecular Biology Consortium (United States)


Published in SPIE Proceedings Vol. 5198:
Hard X-Ray and Gamma-Ray Detector Physics V
Larry A. Franks; Arnold Burger; Ralph B. James; Paul L. Hink, Editor(s)

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