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Proceedings Paper

What can we learn that's new and interesting about condensed matter systems using polarized x rays?
Author(s): P. M. Platzman
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Paper Abstract

This paper presents and analyzes some new features of the scattering of x rays from the condensed matter systems. In particular the polarization and incident frequency degrees of freedom now available at synchrotron sources allow us to focus on some interesting relatively unexplored magnetic properties of solids. After an introduction presenting the general features of this scattering we will look in some detail at elastic scattering experiments in Ho (a spiral anti-ferromagnetic) and UBe13 (a so called heavy fermion anti-ferromagnet). We will also consider spin glasses such as dilute Fe in Cu. This system is an example of a random magnetic system with competing interactions. It undergoes an interesting and rather subtle phase transition. The order parameter for this transition has never been observed. We will present the ideas behind a rather unique magnetic elastic x-ray experiment designed to make a direct measurement of the elusive spin glass order parameter. In all cases we will cover without going into great detail, the basic phenomenon and try to focus on what new physics can be learned from such elastic x-ray scattering experiments. The second part of the talk will present ideas on so called magnetic compton scattering. These experiments require circularly polarized x-rays. They allow us to measure, with rather high accuracy, the ground state wave function of Ferromagnetic systems. The best characterized but still not well understood examples of such systems are the elements Ni and Fe. Preliminary experiments on these ideal elements will be used to demonstrate the kind of information we can obtain. We will also show how this information can be compared with microscopic calculations. In the future, greater resolution should allow us to answer some of the still unanswered basic questions in the theory of itinerant magnetism.

Paper Details

Date Published: 1 November 1991
PDF: 1 pages
Proc. SPIE 1548, Production and Analysis of Polarized X Rays, (1 November 1991); doi: 10.1117/12.50570
Show Author Affiliations
P. M. Platzman, AT&T Bell Labs. (United States)


Published in SPIE Proceedings Vol. 1548:
Production and Analysis of Polarized X Rays
D. Peter Siddons, Editor(s)

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