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Proceedings Paper

X-ray study of W/Si multilayers for the HEFT hard x-ray telescope
Author(s): Kristin K. Madsen; Finn E. Christensen; Carsten P. Jensen; Eric Ziegler; William W. Craig; Kurt S. Gunderson; Jason E. Koglin; K. Pedersen
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Paper Abstract

This paper outlines an in-depth study of the W/Si coated mirrors for the High Energy Focusing Telescope (HEFT). We present data taken at 8, 40 and 60 keV obtained at the Danish Space Research Institute and the European Synchrotron Radiation Facility in Grenoble. The set of samples were chosen to cover the parameter space of sample type, sample size and coating type. The investigation includes a study of the interfacial roughness across the sample surface, as substrates and later as coated, and an analysis of the roughness correlation in the W/Si coatings for N = 10 deposited bilayers. The powerlaw graded flight coating for the HEFT mirrors is studied for uniformity and scatter, as well as its performance at high energies.

Paper Details

Date Published: 29 January 2004
PDF: 12 pages
Proc. SPIE 5168, Optics for EUV, X-Ray, and Gamma-Ray Astronomy, (29 January 2004); doi: 10.1117/12.505665
Show Author Affiliations
Kristin K. Madsen, Danish Space Research Institute (Denmark)
Finn E. Christensen, Danish Space Research Institute (Denmark)
Carsten P. Jensen, Danish Space Research Institute (Denmark)
Eric Ziegler, European Synchrotron Radiation Facility (France)
William W. Craig, Lawrence Livermore National Lab. (United States)
Kurt S. Gunderson, Lawrence Livermore National Lab. (United States)
Jason E. Koglin, Columbia Univ. (United States)
K. Pedersen, Astronomical Observatory/Univ. of Copenhagen (Denmark)


Published in SPIE Proceedings Vol. 5168:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy
Oberto Citterio; Stephen L. O'Dell, Editor(s)

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