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Proceedings Paper

Jitter diagnosis for pico- and femtosecond sources
Author(s): Defu Cai
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Paper Abstract

A new idea based on the sampling transform for measuring very short time jitter of e1ec trical ultra fast pulses is presented in this paper. It is shown that the measurement of a very short time jitter may be replaced by the one of a low level and low speed waveform.

Paper Details

Date Published: 1 January 1992
PDF: 5 pages
Proc. SPIE 1539, Ultrahigh- and High-Speed Photography, Videography, and Photonics '91, (1 January 1992); doi: 10.1117/12.50566
Show Author Affiliations
Defu Cai, Institute of Electronics (China)


Published in SPIE Proceedings Vol. 1539:
Ultrahigh- and High-Speed Photography, Videography, and Photonics '91
Paul A. Jaanimagi, Editor(s)

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