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Proceedings Paper

Sub-lithographic patterning technology for nanowire model catalysts and DNA label-free hybridization detection
Author(s): Yang-Kyu Choi; Jeff Grunes; Joon Sung Lee; Ji Zhu; Gabor A. Somorjai; Luke P. Lee; Jeffrey Bokor
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Paper Abstract

Sub-lithographic nanowires and nanogaps were fabricated by spacer lithography (size reduction technology), which is a parallel processes for nanometer pattern generation on a wafer scale with resolution comparable to the best electron beam lithography. Sub-10nm line width is defined by using a sacrificial ultrathin film deposited by low pressure chemical vapor deposition (LPCVD), in a process similar to formation of gate sidewall spacers in CMOS processing. Furthermore, a novel method called iterative spacer lithography (ISL) is demonstrated by alternating materials and repeating the spacer lithography multiple times in order to multiply the pattern density. Silicon structures with sub-10nm width fabricated by this process were used as a mold in nanoimprint lithography and lift-off patterning of sub-30nm platinum nanowires for use as model catalyst systems. A similar process called reversed spacer lithography (RSL) is demonstrated to form sub-10nm nanogap device and fluid channels in poly-Si. This nanogap device provides a label-free tool for DNA hybridization detection based on measuring capacitance changes in the gap.

Paper Details

Date Published: 15 October 2003
PDF: 10 pages
Proc. SPIE 5220, Nanofabrication Technologies, (15 October 2003); doi: 10.1117/12.505409
Show Author Affiliations
Yang-Kyu Choi, Univ. of California, Berkeley (United States)
Jeff Grunes, Univ. of California, Berkeley (United States)
Lawrence Berkeley National Lab. (United States)
Joon Sung Lee, Univ. of California, Berkeley (United States)
Ji Zhu, Univ. of California, Berkeley (United States)
Lawrence Berkeley National Lab. (United States)
Gabor A. Somorjai, Univ. of California, Berkeley (United States)
Lawrence Berkeley National Lab. (United States)
Luke P. Lee, Univ. of California, Berkeley (United States)
Jeffrey Bokor, Univ. of California, Berkeley (United States)


Published in SPIE Proceedings Vol. 5220:
Nanofabrication Technologies
Elizabeth A. Dobisz, Editor(s)

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