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Proceedings Paper

Scatter and contamination of a low-scatter mirror
Author(s): Joseph R. McNeely; Malcolm B. McIntosh; M. Alfred Akerman
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Paper Abstract

The contamination of high-quality, space-borne optics by particles originating from baffle systems could significantly alter the performance of the optics. To assess this potential problem, the bidirectional reflectance distribution function (BRDF) of a low-scatter beryllium mirror was measured at the 10.6-micron wavelength with the mirror in the 'cleaned' state and after controlled contaminations with aluminum oxide powder up to 100 microns in size. The aluminum oxide powder was used to simulate particles which could be released from a typical baffle material. After contamination, the particle size distribution on the mirror surface was statistically sampled using a scanning electron microscope image analysis technique. The BRDF measurements of the contaminated mirror were compared to Mie scattering theory calculations for subwavelength, wavelength, and superwavelength particles sizes.

Paper Details

Date Published: 1 December 1991
PDF: 11 pages
Proc. SPIE 1530, Optical Scatter: Applications, Measurement, and Theory, (1 December 1991); doi: 10.1117/12.50518
Show Author Affiliations
Joseph R. McNeely, Martin Marietta Energy Systems, Inc. (United States)
Malcolm B. McIntosh, Martin Marietta Energy Systems, Inc. (United States)
M. Alfred Akerman, Martin Marietta Energy Systems, Inc. (United States)

Published in SPIE Proceedings Vol. 1530:
Optical Scatter: Applications, Measurement, and Theory
John C. Stover, Editor(s)

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