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Proceedings Paper

Bidirectional reflectance distribution function raster scan technique for curved samples
Author(s): Malcolm B. McIntosh; Joseph R. McNeely
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Paper Abstract

A measurement technique has been developed for mapping the bidirectional reflectance distribution function (BRDF) over the entire surface of a curved sample at fixed angles of incidence and scatter. The instrument used was the Toomay, Mathis & Associates, Inc., Complete Angle Scatter Instrument at the Optical Characterization Laboratory (OCL) in Oak Ridge, Tennessee. Raster scans and maps of the BRDF of flat samples are relatively straightforward with this instrument, however, similar measurements of curved samples are more complex. The inherent problems involved in performing BRDF mapping on a non-flat optic will be discussed and one solution to those problems will be described for an Optics Manufacturing Operations Development and Integration Laboratories (MODIL) parabolic assessment mirror.

Paper Details

Date Published: 1 December 1991
PDF: 6 pages
Proc. SPIE 1530, Optical Scatter: Applications, Measurement, and Theory, (1 December 1991); doi: 10.1117/12.50516
Show Author Affiliations
Malcolm B. McIntosh, Martin Marietta Energy Systems, Inc. (United States)
Joseph R. McNeely, Martin Marietta Energy Systems, Inc. (United States)

Published in SPIE Proceedings Vol. 1530:
Optical Scatter: Applications, Measurement, and Theory
John C. Stover, Editor(s)

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