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Proceedings Paper

Mapping of imbedded contaminants in transparent material by optical scatter
Author(s): Donald A. Rudberg; John C. Stover; Douglas E. McGary
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Paper Abstract

The paper reviews the design of an instrument designed to detect and map internal defects found in PMMA plastic. The material is used to manufacture intraocular lenses and must be free of defects larger than about 20 micrometers for a variety of safety, manufacturing and cosmetic reasons. The instrument detects scatter from a diode with a CCD array camera to map defect location. This information is used to avoid manufacturing lenses that will eventually be rejected.

Paper Details

Date Published: 1 December 1991
PDF: 8 pages
Proc. SPIE 1530, Optical Scatter: Applications, Measurement, and Theory, (1 December 1991); doi: 10.1117/12.50512
Show Author Affiliations
Donald A. Rudberg, TMA Technologies, Inc. (United States)
John C. Stover, TMA Technologies, Inc. (United States)
Douglas E. McGary, TMA Technologies, Inc. (United States)


Published in SPIE Proceedings Vol. 1530:
Optical Scatter: Applications, Measurement, and Theory
John C. Stover, Editor(s)

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