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Proceedings Paper

High resolution electrooptic polymer probe for testing electric field distribution
Author(s): Maobin Yi; Hongbo Zhang; Alin Hou; Ying Hou; Xin Yan; Xiaohong Chuai; Daming Zhang
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Proc. SPIE 5180, Optical Manufacturing and Testing V, ; doi: 10.1117/12.504975
Show Author Affiliations
Maobin Yi, Jilin Univ. (China)
Hongbo Zhang, Jilin Univ. (China)
Alin Hou, Jilin Univ. (China)
Ying Hou, Jilin Univ. (China)
Xin Yan, Jilin Univ. (China)
Xiaohong Chuai, Jilin Univ. (China)
Daming Zhang, Jilin Univ. (China)


Published in SPIE Proceedings Vol. 5180:
Optical Manufacturing and Testing V
H. Philip Stahl, Editor(s)

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