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Proceedings Paper

Sinusoidal surfaces as standards for BRDF instruments
Author(s): Egon Marx; Thomas Robert Lettieri; Theodore V. Vorburger; Malcolm B. McIntosh
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Paper Abstract

This study of light scattered by sinusoidal surfaces shows that such a configuration can be used as a material standard to help calibrate instruments that measure the BRDF of arbitrary surfaces. Measured and computed values of the power scattered into the diffraction peaks show good agreement, and such calculations can be further improved and used to verify the standards.

Paper Details

Date Published: 1 December 1991
PDF: 7 pages
Proc. SPIE 1530, Optical Scatter: Applications, Measurement, and Theory, (1 December 1991); doi: 10.1117/12.50492
Show Author Affiliations
Egon Marx, National Institute of Standards and Technology (United States)
Thomas Robert Lettieri, National Institute of Standards and Technology (United States)
Theodore V. Vorburger, National Institute of Standards and Technology (United States)
Malcolm B. McIntosh, Martin Marietta Energy Systems, Inc. (United States)


Published in SPIE Proceedings Vol. 1530:
Optical Scatter: Applications, Measurement, and Theory
John C. Stover, Editor(s)

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