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Proceedings Paper

Temporal characterization of a picosecond-laser-pumped x-ray laser for applications
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Paper Abstract

Compact soft x-ray laser sources are now used routinely for various applications primarily because of their high repetition rate, high photon fluence and short pulse duration characteristics. For some of these applications, for example interferometry of high density laser-produced plasmas, longer optical drive pulses, 6 - 13 ps (FWHM), have been implemented to maximize the x-ray output and coherence. It is therefore important to know the x-ray laser pulse length, shape and repeatability for these specific experiments as a baseline measurement but also to better understand the temporal behavior as a function of the pumping conditions in general. We report a detailed temporal characterization of the picosecond-driven 14.7 nm Ni-like Pd ion x-ray laser on the Compact Multipulse Terawatt (COMET) laser at LLNL using an ultrafast x-ray streak camera measurement of a horizontal slice of the near-field x-ray laser pattern. This is measured as a function of the chirped pulse amplification pumping laser conditions, including varying the pump pulse from 0.5 - 27 ps (FWHM), varying the plasma column length as well as investigating traveling wave (TW) and non-TW irradiation conditions.

Paper Details

Date Published: 19 December 2003
PDF: 9 pages
Proc. SPIE 5197, Soft X-Ray Lasers and Applications V, (19 December 2003); doi: 10.1117/12.504904
Show Author Affiliations
James Dunn, Lawrence Livermore National Lab. (United States)
Raymond F. Smith, Lawrence Livermore National Lab. (United States)
Ronnie Shepherd, Lawrence Livermore National Lab. (United States)
Rex Booth, Lawrence Livermore National Lab. (United States)
Joseph Nilsen, Lawrence Livermore National Lab. (United States)
James R. Hunter, Lawrence Livermore National Lab. (United States)
Vyacheslav N. Shlyaptsev, Univ. of California/Davis (United States)


Published in SPIE Proceedings Vol. 5197:
Soft X-Ray Lasers and Applications V
Ernst E. Fill; Szymon Suckewer, Editor(s)

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