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Proceedings Paper

High-sensitivity x-ray polarimetry with amorphous-silicon active-matrix pixel proportional counters
Author(s): J. Kevin Black; Phil Deines-Jones; Keith Jahoda; Steve E. Ready; Robert A. Street
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Paper Abstract

Photoelectric X-ray polarimeters based on pixel micropattern gas detectors (MPGDs) offer order-of-magnitude improvement in sensitivity over more traditional techniques based on X-ray scattering. This new technique places some of the most interesting astronomical observations within reach of even a small, dedicated mission. The most sensitive instrument would be a photoelectric polarimeter at the focus of a very large mirror, such as the planned XEUS. Our efforts are focused on a smaller pathfinder mission, which would achieve its greatest sensitivity with large-area, low-background, collimated polarimeters. We have recently demonstrated a MPGD polarimeter using amorphous silicon thin-film transistor (TFT) readout suitable for the focal plane of an X-ray telescope. All the technologies used in the demonstration polarimeter are scalable to the areas required for a high-sensitivity collimated polarimeter.

Paper Details

Date Published: 3 February 2004
PDF: 8 pages
Proc. SPIE 5165, X-Ray and Gamma-Ray Instrumentation for Astronomy XIII, (3 February 2004); doi: 10.1117/12.504862
Show Author Affiliations
J. Kevin Black, Forbin Scientific (United States)
NASA Goddard Space Flight Ctr. (United States)
Phil Deines-Jones, Universities Space Research Association (United States)
Keith Jahoda, NASA Goddard Space Flight Ctr. (United States)
Steve E. Ready, Palo Alto Research Center (United States)
Robert A. Street, Palo Alto Research Center (United States)


Published in SPIE Proceedings Vol. 5165:
X-Ray and Gamma-Ray Instrumentation for Astronomy XIII
Kathryn A. Flanagan; Oswald H. W. Siegmund, Editor(s)

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