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Proceedings Paper

High-speed imaging polarimeter
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Paper Abstract

A high speed Mueller matrix imaging polarimeter is presented. The instrument enables measurement of the full Mueller matrix in transmission, reflection, or retro-reflection. The Mueller matrix provides a complete description of the polarization transforming properties of the sample. The retardance, diattenuation, polarizance, and depolarization are all characterized by the polarimeter. The polarimeter is able to measure the polarization properties of samples ranging from sub-millimeter optical components to large optics. The imaging capabilities can be modified to measure the polarization properties across the surface of the sample or as a function of the angle through the sample. The dual rotating retarder polarimeter provides up to sixty-two full Mueller matrix images per second. Instrument details, measurement techniques, example data, and applications are presented.

Paper Details

Date Published: 12 December 2003
PDF: 9 pages
Proc. SPIE 5158, Polarization Science and Remote Sensing, (12 December 2003); doi: 10.1117/12.504439
Show Author Affiliations
Justin Wolfe, Optical Sciences Ctr./Univ. of Arizona (United States)
Russell A. Chipman, Optical Sciences Ctr./Univ. of Arizona (United States)

Published in SPIE Proceedings Vol. 5158:
Polarization Science and Remote Sensing
Joseph A. Shaw; J. Scott Tyo, Editor(s)

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