Share Email Print
cover

Proceedings Paper

High-resolution monochromators for the utilization of the radiation from an EUV free-electron laser
Author(s): Luca Poletto; Paolo Azzolin; Giuseppe Tondello
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We present the optical design of high-resolution monochromators for the utilization of the radiation from a FEL at 40 and 10 nm, in the framework of a proposal made from Elettra Synchrotron (Trieste, Italy) to the Italian Ministry of Education, Universities and Research for the construction and operation of an ultra-high brillance source in the UV and X region. Since the FEL emission is expected to be highly monochromatic (λ/Δλ≈10000), a monochromator is useful only if able to provide a spectral resolution higher than the intrinsic FEL resolution (λ/Δλ>100000). Two systems are presented: 1) normal-incidence configurations with multilayer-coated optics; 2) grazing-incidence configurations with a plane grating operated in conical diffraction. Normal-incidence configurations have very high spectral resolution, but the spectral band of operation is limited by the multilayer coating, so optics with different coatings have to be used when the FEL is tuned within the spectral region of operation. Configurations in conical diffraction have also very high resolution, high efficiency and a wide spectral band of operation.

Paper Details

Date Published: 28 January 2004
PDF: 10 pages
Proc. SPIE 5194, Fourth-Generation X-Ray Sources and Ultrafast X-Ray Detectors, (28 January 2004); doi: 10.1117/12.504162
Show Author Affiliations
Luca Poletto, INFM, Univ. degli Studi di Padova (Italy)
Paolo Azzolin, INFM, Univ. degli Studi di Padova (Italy)
Giuseppe Tondello, INFM, Univ. degli Studi di Padova (Italy)


Published in SPIE Proceedings Vol. 5194:
Fourth-Generation X-Ray Sources and Ultrafast X-Ray Detectors
Zenghu Chang; Roman O. Tatchyn; Jean-Claude Kieffer; Jerome B. Hastings, Editor(s)

© SPIE. Terms of Use
Back to Top