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Proceedings Paper

Beam splitting and recombining of the radiation from an EUV free-electron laser by means of reflection gratings
Author(s): Luca Poletto; Paolo Azzolin; Giuseppe Tondello; Giampiero Naletto
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Paper Abstract

We present the optical design of systems for the splitting of the radiation from a FEL at 40 and 10 nm, in the framework of a proposal made fro Elettra Synchrotron (Trieste, Italy) to the Italian Ministry of Education, Universities and Research for the construction and operation of an ultra-high brillance source in the EUV and soft X-ray region. It is important to design systems for the beam-splitting of the EUV radiation, both for having the FEL radiation available simultaneously to several experiments, and for the division and recombination of the beam (pump-probe techniques). We present systems with a grazing-incidence plane grating, which is illuminated by the single FEL beam and gives several output beams (the zero order and the diffracted orders). The grating gives intrinsically a time stretching of the diffracted beam, so time-compensated configurations must be used, i.e. the configurations in which a second grating compensates for the distortion given by the first grating. Different systems are presented: 1) splitting of the primary beam in several secondary beams for different experiments; 2) splitting and recombining of the primary beam in two beams with variable delay from two different directions; 3) splitting and recombining of the primary beam in two beams with variable delay and same direction.

Paper Details

Date Published: 28 January 2004
PDF: 10 pages
Proc. SPIE 5194, Fourth-Generation X-Ray Sources and Ultrafast X-Ray Detectors, (28 January 2004); doi: 10.1117/12.504160
Show Author Affiliations
Luca Poletto, Univ. degli Studi di Padova, INFM (Italy)
Paolo Azzolin, Univ. degli Studi di Padova, INFM (Italy)
Giuseppe Tondello, Univ. degli Studi di Padova, INFM (Italy)
Giampiero Naletto, Univ. degli Studi di Padova, INFM (Italy)


Published in SPIE Proceedings Vol. 5194:
Fourth-Generation X-Ray Sources and Ultrafast X-Ray Detectors
Zenghu Chang; Roman O. Tatchyn; Jean-Claude Kieffer; Jerome B. Hastings, Editor(s)

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