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Proceedings Paper

DWDM interleavers using analog birefringence structures
Author(s): Juan Zhang; Liren Liu; Haixia Ren; Yu Zhou
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Paper Abstract

Birefringent interleaving filters are very useful in DWDM, but it is quite difficult to design the birefringent interleavers with the frequency spacing smaller than 50GHz. Because of the small birefringence of all the natural and synthesized crystals, the sizes of birefringent plates in this use become impossible large. This paper proposes an analog birefringence structure, which is suitable for such a task. The structure consists of a pair of double-refraction plates for splitting and combination, respectively, and in between a set of two optical plates of different indices of refraction. An incident beam is first divided into two separated beams by the first plate, which then pass through the individual plates to delay with different refraction. Finally the two delayed beams are combined spatially into a single beam by the second plate. It can be understood that this structure has the function just the same as a birefringent plate. The difference of the refractive indices of the two optical plates can be very large (up to 0.8), so that the analog birefringence structure is not only practically possible but also very compact. As usual, a cascade of analog birefringence structures will form a flat-passband interleaver. The detailed designs are given. The experiment on an analog birefringence structure is demonstrated as well.

Paper Details

Date Published: 6 November 2003
PDF: 6 pages
Proc. SPIE 5174, Novel Optical Systems Design and Optimization VI, (6 November 2003); doi: 10.1117/12.504009
Show Author Affiliations
Juan Zhang, Shanghai Institute of Optics and Fine Mechanics (China)
Liren Liu, Shanghai Institute of Optics and Fine Mechanics (China)
Haixia Ren, Shanghai Institute of Optics and Fine Mechanics (China)
Yu Zhou, Shanghai Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 5174:
Novel Optical Systems Design and Optimization VI
Jose M. Sasian; R. John Koshel; Paul K. Manhart, Editor(s)

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