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Proceedings Paper

Fabrication and determination of refractive index profile of the planar waveguides by wedge technique
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Paper Abstract

In this paper we will present determination of refractive index profile of an ion exchanged planar waveguide using wedge technique. The sample preparation, data analysis and experimental results will be presented.

Paper Details

Date Published: 26 February 2004
PDF: 7 pages
Proc. SPIE 5252, Optical Fabrication, Testing, and Metrology, (26 February 2004); doi: 10.1117/12.503918
Show Author Affiliations
Seyed Mohammad Reza Sadat Hosseini, Iran Telecommunication Research Ctr. (Iran)
Ahmad Darudi, Institute for Advanced Studies in Basic Sciences (Iran)
Zanjan Univ. (Iran)
Mohammad Taghi Tavassoly, Institute for Advanced Studies in Basic Sciences (Iran)
Tehran Univ. (Iran)


Published in SPIE Proceedings Vol. 5252:
Optical Fabrication, Testing, and Metrology
Roland Geyl; David Rimmer; Lingli Wang, Editor(s)

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