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Proc. SPIE 5207, Wavelets: Applications in Signal and Image Processing X, ; doi: 10.1117/12.503892
Show Author Affiliations
Radu V Balan, Siemens Corporate Research, Inc. (United States)
Zeph Landau, Univ. of California/Berkeley (United States)


Published in SPIE Proceedings Vol. 5207:
Wavelets: Applications in Signal and Image Processing X
Michael A. Unser; Akram Aldroubi; Andrew F. Laine, Editor(s)

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