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Proceedings Paper

Two-dimensional asymmetrical Bragg diffraction for submicrometer computer tomography
Author(s): Marco Stampanoni; Gunther Borchert; Rafael Abela
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Paper Abstract

With the advent of high brilliance, third generation synchrotron radiation sources, the spatial resolution of non-destructive X-ray tomographic investigations can be scaled down to the micrometer or even submicrometer range while the coherent nature of the radiation extends the traditional absorption imaging techniques towards edge-enhanced or phase-sensitive measurements. The performance of the presently used detectors is limited by scintillation properties, optical light coupling and charge coupled device granularity which impose a practical limit of about 1 micrometer spatial resolution with efficiencies of a few percent. We developed a detector called Bragg magnifier which exploits double asymmetrical Bragg diffraction from flat crystals to efficiently produce distortion- and aberrations-free X-ray images with magnification factors up to 150x150 and pixel sizes of less than 100x100nm2.

Paper Details

Date Published: 23 December 2003
PDF: 9 pages
Proc. SPIE 5195, Crystals, Multilayers, and Other Synchrotron Optics, (23 December 2003); doi: 10.1117/12.503825
Show Author Affiliations
Marco Stampanoni, Paul Scherrer Institut (Switzerland)
Gunther Borchert, Technische Univ. Muenchen (Germany)
Rafael Abela, Paul Scherrer Institut (Switzerland)

Published in SPIE Proceedings Vol. 5195:
Crystals, Multilayers, and Other Synchrotron Optics
Tetsuya Ishikawa; Albert T. Macrander; James L. Wood, Editor(s)

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