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Proceedings Paper

Wavelet-based image improvement for compact x-ray microscopy
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Proc. SPIE 5196, Laser-Generated and Other Laboratory X-Ray and EUV Sources, Optics, and Applications, ; doi: 10.1117/12.503788
Show Author Affiliations
Heide Stollberg, Royal Institute of Technology (Sweden)
Jacques Boutet de Monvel, Karolinska Institute (Sweden)
Göran A. Johansson, Royal Institute of Technology (Sweden)
Hans M. Hertz, Royal Institute of Technology (Sweden)


Published in SPIE Proceedings Vol. 5196:
Laser-Generated and Other Laboratory X-Ray and EUV Sources, Optics, and Applications
George A. Kyrala; Jean-Claude J. Gauthier; Carolyn A. MacDonald; Ali M. Khounsary, Editor(s)

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