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Proceedings Paper

Characterization of the new FX1 x-ray streak camera
Author(s): Vincent Pitre; Sebastien Magnan; Jean-Claude Kieffer; Fabien Dorchies; Francois Salin; Catherine Goulmy; Jean-Claude Rebuffie
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Paper Abstract

We present the characterization of an ultrafast x-ray streak camera based on a new bilamellar x-ray tube. This camera, named FX1, has been tested in static (imaging) and dynamic (sweep) mode with several continuous and pulsed sub-picosecond UV and X-ray sources. The FX1 camera was designed to overcome some limitations observed with the PX1 camera which has been used previously at INRS to achieve high resolution sub-picosecond time resolved spectroscopy of ultrafast laser produced plasmas. Line Spread Function measurements indicated a strong improvement of the static image contribution to the temporal resolution compared to the PX1 camera performances [Rev. Sci. Instr. 71, 3627, 2000]. Furthermore a much higher dc extraction field can now be sustained at the photocathode-acceleration slit region. The FX1 camera has been successfully operated in various experimental conditions. An upper limit of the temporal response of the FX1 has been measured in the keV x-ray range in single shot mode with a laser-based x-ray source (2keV) having a duration (FWHM) of 1.4 ps. The FX1 camera has also been coupled to photoconductive switches and testesd in accumulation mode [Rev. Sci. Instr. 73, 1617, 2002] with VUV light produced with the 1 kHz Ti:sapphire laser of the CELIA. A newly assembled test-bench is now currently used at INRS for the characterisation of streak cameras in both single-shot and accumulation mode with the 10Hz Ti:sapphire laser of INRS.

Paper Details

Date Published: 28 January 2004
PDF: 8 pages
Proc. SPIE 5194, Fourth-Generation X-Ray Sources and Ultrafast X-Ray Detectors, (28 January 2004); doi: 10.1117/12.503581
Show Author Affiliations
Vincent Pitre, INRS-Energie, Materiaux et Telecommunications, Univ. du Quebec (Canada)
Sebastien Magnan, INRS-Energie, Materiaux et Telecommunications, Univ. du Quebec (Canada)
Jean-Claude Kieffer, INRS-Energie, Materiaux et Telecommunications, Univ. du Quebec (Canada)
Fabien Dorchies, Univ. de Bordeaux I (France)
Francois Salin, Univ. de Bordeaux I (France)
Catherine Goulmy, Photonis (France)
Jean-Claude Rebuffie, Photonis (France)

Published in SPIE Proceedings Vol. 5194:
Fourth-Generation X-Ray Sources and Ultrafast X-Ray Detectors
Zenghu Chang; Roman O. Tatchyn; Jean-Claude Kieffer; Jerome B. Hastings, Editor(s)

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