Share Email Print
cover

Proceedings Paper

Highly efficient x-ray imaging and backlighting schemes based on spherically bent crystals
Author(s): Tatiana A. Pikuz; Anatoly Ya. Faenov; Igor Yu. Skobelev; Alexandr I. Magunov; Manuel Sanchez del Rio; Lucia Alianelli; Giuseppe Baldacchini; Francesco Flora; Sarra Bollanti; Paulo Di Lazzaro; Daniele Murra; Giuseppe Tomassetti; Antonio Ritucci; Armando Reale; Lucia Reale; Massimo Francucci; Sergio Martellucci; Giovanni Petrocelli
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

New approaches of a spectrally tunable backlighting schemes based on a spherically bent crystal are considered. In a contrary to the traditional backlighting scheme, in which the investigated objects should be placed between the backlighter and the crystal, for the considered schemes an object is placed downstream of the crystal, before the tangential or after the sagittal focus and an image of the object is recorded at the distance from the object corresponded to the needed magnification. The magnification is defined by the ratio of the distances form the sagittal focus to the detector and from the object to the sagittal focus. A ray tracing modeling and experimental images of test meshes, obtained at an incidence angles of the backlighter radiation of 10° and 22°, are presented. It is demonstrated that, at incident angles up to 22°, a linear transformation of the obtained astigmatic images allows to reconstruct them with an accuracy (5 - 15%). A spatial resolution around 10 μm in a field of view of some mm2 is achieved, for the spectral range around 9 Å. It is also demonstrated that spherically bent crystals could be used for X-ray imaging of a self emitting plasma structures with a spatial resolution at least 50 μm in a field of view of some square millimeters for angles of incidence up to 22°.

Paper Details

Date Published: 7 January 2004
PDF: 13 pages
Proc. SPIE 5196, Laser-Generated and Other Laboratory X-Ray and EUV Sources, Optics, and Applications, (7 January 2004); doi: 10.1117/12.503580
Show Author Affiliations
Tatiana A. Pikuz, VNIIFTRI (Russia)
Anatoly Ya. Faenov, VNIIFTRI (Russia)
Igor Yu. Skobelev, VNIIFTRI (Russia)
Alexandr I. Magunov, VNIIFTRI (Russia)
Manuel Sanchez del Rio, European Synchrotron Radiation Facility (France)
Lucia Alianelli, Institut Laue-Langevin (France)
INFM (Italy)
Giuseppe Baldacchini, ENEA Frascati (Italy)
Francesco Flora, ENEA Frascati (Italy)
Sarra Bollanti, ENEA Frascati (Italy)
Paulo Di Lazzaro, ENEA Frascati (Italy)
Daniele Murra, ENEA Frascati (Italy)
Giuseppe Tomassetti, INFM (Italy)
Univ. degli Studi dell'Aquila (Italy)
LNGS-INFN (Italy)
Antonio Ritucci, INFM (Italy)
Univ. degli Studi dell'Aquila (Italy)
LNGS-INFN (Italy)
Armando Reale, INFM (Italy)
Univ. degli Studi dell'Aquila (Italy)
LNGS-INFN (Italy)
Lucia Reale, INFM (Italy)
Univ. degli Studi dell'Aquila (Italy)
LNGS-INFN (Italy)
Massimo Francucci, INFM (Italy)
Univ. degli Studi di Roma Tor Vergata (Italy)
Sergio Martellucci, INFM (Italy)
Univ. degli Studi di Roma Tor Vergata (Italy)
Giovanni Petrocelli, INFM (Italy)
Univ. degli Studi di Roma Tor Vergata (Italy)


Published in SPIE Proceedings Vol. 5196:
Laser-Generated and Other Laboratory X-Ray and EUV Sources, Optics, and Applications
George A. Kyrala; Jean-Claude J. Gauthier; Carolyn A. MacDonald; Ali M. Khounsary, Editor(s)

© SPIE. Terms of Use
Back to Top