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Proceedings Paper

Best fit ellipse for cell shape analysis
Author(s): Rahman Wali; Michael Colef; Joseph Barba
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Paper Abstract

Shape analysis is important in classification where deviation of a contour from a model are measured. In pathology, deviation of nuclear contour from an ellipse is sometime useful in cell clas— sification. This paper presents a method based on Fourier series expansion, to determine the best fit ellipse to a given contour by minimizing the difference in the ellipticity factors. We show that the geometric mean should be used for the contour center instead of the conventional centroid. The method is applicable to multi value contours. Examples are presented.

Paper Details

Date Published: 1 November 1991
PDF: 10 pages
Proc. SPIE 1606, Visual Communications and Image Processing '91: Image Processing, (1 November 1991); doi: 10.1117/12.50351
Show Author Affiliations
Rahman Wali, City College/CUNY (United States)
Michael Colef, New York Institute of Technology (United States)
Joseph Barba, City College/CUNY (United States)


Published in SPIE Proceedings Vol. 1606:
Visual Communications and Image Processing '91: Image Processing
Kou-Hu Tzou; Toshio Koga, Editor(s)

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