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Proceedings Paper

Three-dimensional orientation from texture using Gabor wavelets
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Paper Abstract

We present a method for measuring the three-dimensional orientation of planar surfaces. We derive a model relating the spatially varying instantaneous frequency of the image texture to the instantaneous frequency of the surface texture, to the orientation of the surface, and to the parameters of the imaging system. We measure the localized frequency at each image point with Gabor wavelets and use it to solve for the surface orientation according to the model. The method does not require the extraction of discrete texture elements. The algorithm has a mean error of about 5 degrees in the measured slant and tilt on a test set of 12 real-world surfaces.

Paper Details

Date Published: 1 November 1991
PDF: 13 pages
Proc. SPIE 1606, Visual Communications and Image Processing '91: Image Processing, (1 November 1991); doi: 10.1117/12.50344
Show Author Affiliations
Boaz J. Super, Univ. of Texas/Austin (United States)
Alan Conrad Bovik, Univ. of Texas/Austin (United States)

Published in SPIE Proceedings Vol. 1606:
Visual Communications and Image Processing '91: Image Processing
Kou-Hu Tzou; Toshio Koga, Editor(s)

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