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Proceedings Paper

Characterization of CsI photocathodes at grazing incidence for use in a unit quantum efficiency x-ray streak camera
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Paper Abstract

The performance of CsI photocathodes has been characterized for use with grazing incidence soft x-rays. The total electron yield and pulsed quantum efficiency from a CsI photocathode has been measured in a reflection geometry as a function of photon energy (100 eV to 1 keV), angle of incidence and the electric field between the anode and photocathode. The total electron yield and pulsed quantum efficiency increase as the x-ray penetration depth approaches the secondary electron escape depth. Unit quantum efficiency in a grazing incidence geometry is demonstrated. A weak electric field dependence is observed for the total yield measurements; whilst no significant dependence is found for the pulsed quantum efficiency. Theoretical predictions agree accurately with experiment.

Paper Details

Date Published: 28 January 2004
PDF: 10 pages
Proc. SPIE 5194, Fourth-Generation X-Ray Sources and Ultrafast X-Ray Detectors, (28 January 2004); doi: 10.1117/12.503412
Show Author Affiliations
Donnacha P. Lowney, Lawrence Berkeley National Lab. (United States)
Dublin City Univ. (Ireland)
Philip A. Heimann, Lawrence Berkeley National Lab. (United States)
Eric M. Gullikson, Lawrence Berkeley National Lab. (United States)
Andrew G. MacPhee, Univ. of California/Berkeley (United States)
Roger W. Falcone, Univ. of California/Berkeley (United States)
Howard A. Padmore, Lawrence Berkeley National Lab. (United States)


Published in SPIE Proceedings Vol. 5194:
Fourth-Generation X-Ray Sources and Ultrafast X-Ray Detectors
Zenghu Chang; Roman O. Tatchyn; Jean-Claude Kieffer; Jerome B. Hastings, Editor(s)

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