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Proceedings Paper

Fourier cross-correlation and invariance transformation for affine groups
Author(s): Joseph Segman
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Paper Abstract

A framework for an optimal analysis of a large class of patterns deformed by affine transformation groups is presented. This approach is based on the properties of the Fourier cross-correlation and Lie groups theory. Group properties such as homogeneity, symmetry, and isometry are utilized naturally. In particular, we consider the important groups of similarities and rigid motion in plane and space. The method is general to any object functions: picture, shape, curve, etc.

Paper Details

Date Published: 1 November 1991
PDF: 15 pages
Proc. SPIE 1606, Visual Communications and Image Processing '91: Image Processing, (1 November 1991); doi: 10.1117/12.50339
Show Author Affiliations
Joseph Segman, Technion - Israel Institute of Technology (Israel)


Published in SPIE Proceedings Vol. 1606:
Visual Communications and Image Processing '91: Image Processing
Kou-Hu Tzou; Toshio Koga, Editor(s)

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