Share Email Print

Proceedings Paper

Algorithm for quality inspection of characters printed on chip resistors
Author(s): Yasuhiko Numagami; Yasuyuki Hattori; Osamu Nakamura; Toshi Minami
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

An algorithm for quality inspection of characters printed on chip resistors is presented in this paper. Chip resistors are extremely small electronic parts used in small electronic devices, whose production have increased because of their ease of installation. To decrease production costs and ensure uniformity of quality, chip resistors are produced in automated manufacturing plants. Appearance inspection, however, still depends on visual inspection. It is quite difficult, however, to examine the printing quality of the characters printed on the chip resistor, because the characters are very small, reaching the limit of printing technology. Another difficulty is that, at present, there is no standard of quality. Only a few manuals exist describing defects. These have been written for use in individual factories and differ from factory to factory. Furthermore, even in one factory the criteria vary from one person to another. An automatic quality inspection system for the characters printed on such small chip resistors is urgently required.

Paper Details

Date Published: 1 November 1991
PDF: 10 pages
Proc. SPIE 1606, Visual Communications and Image Processing '91: Image Processing, (1 November 1991); doi: 10.1117/12.50324
Show Author Affiliations
Yasuhiko Numagami, Kogakuin Univ. (Japan)
Yasuyuki Hattori, Kogakuin Univ. (Japan)
Osamu Nakamura, Kogakuin Univ. (Japan)
Toshi Minami, Kogakuin Univ. (Japan)

Published in SPIE Proceedings Vol. 1606:
Visual Communications and Image Processing '91: Image Processing
Kou-Hu Tzou; Toshio Koga, Editor(s)

© SPIE. Terms of Use
Back to Top