Share Email Print
cover

Proceedings Paper

Alternative measuring modes for scanning probe instrumentation
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The need for fast and accurate inspection of small sample features is eminent considering the developments in micro and nano technology. The scanning probe microscope (SPM) offers extreme resolution and even accuracy when properly calibrated but the principle of operation result in inherently slow acquisition of the measurement data. Therefore scanning probe microscopes are rarely deployed in industrial in-line inspection and quality control where the time aspect usually is critical. We propose an alternative mode of operation that can considerably speed up SPM measurements. In this mode only the areas of interest are probe with maximum accuracy while the rest of the imaging is ignored. The measuring mode is best suited when a-priori information of the surface is available, like in an industrial production line.

Paper Details

Date Published: 20 November 2003
PDF: 4 pages
Proc. SPIE 5190, Recent Developments in Traceable Dimensional Measurements II, (20 November 2003); doi: 10.1117/12.503069
Show Author Affiliations
K. Richard Koops, NMi-Institute for Metrology and Technology (Netherlands)
Kai Dirscherl, NMi-Institute for Metrology and Technology (Netherlands)


Published in SPIE Proceedings Vol. 5190:
Recent Developments in Traceable Dimensional Measurements II
Jennifer E. Decker; Nicholas Brown, Editor(s)

© SPIE. Terms of Use
Back to Top