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Proceedings Paper

Registration of multi-aspect InSAR images
Author(s): Wolfgang Middelmann; Vadim Pepelka; Ulrich Thoennessen
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Paper Abstract

The extensive knowledge of scenes is necessary for change detection or mission planning. Unfortunately, InSAR images have zones with full or partial loss of information, e.g. in shadow areas. We have developed an algorithm for registration and fusion of multi-aspect InSAR images to replace shadow zones in the image of the first aspect by corresponding data taken from another aspect. The investigations were carried out with using of X band images obtained for two aspects. The two aspect images were recorded from two contrary flight courses. The images were delivered as intensity and unwrapped phase of forest, rural and urban terrain. The registration is based on the consecutive application of three separate matching algorithms: matching straight lines, matching contour sequences, and matching based on the Fourier-Mellin transform. The different matching algorithms are optimized for working with the SAR images having different contents. The main peculiarities of the registration algorithm are the methods of structural matching brightness contours calculated by standard edge filters. The shadow borders are excluded from the gradient field by a heuristic algorithm. The contours are extracted by a watershed- or a maximum gradient tracking algorithm. The matching is very robust. It is rather computationally expensive, thus a hierarchical structural matching is used to decrease the computational complexity. The multi-stage contour matching provides a fast and reliable registration and fusion.

Paper Details

Date Published: 12 September 2003
PDF: 12 pages
Proc. SPIE 5095, Algorithms for Synthetic Aperture Radar Imagery X, (12 September 2003); doi: 10.1117/12.502306
Show Author Affiliations
Wolfgang Middelmann, FGAN-Forschungsinstitut fuer Optronik und Mustererkennung (Germany)
Vadim Pepelka, S.I. Vavilov State Optical Institute (Russia)
Ulrich Thoennessen, FGAN-Forschungsinstitut fuer Optronik und Mustererkennung (Germany)


Published in SPIE Proceedings Vol. 5095:
Algorithms for Synthetic Aperture Radar Imagery X
Edmund G. Zelnio; Frederick D. Garber, Editor(s)

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