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Proceedings Paper

Optical fiber Raman amplifier and distributed fiber Raman sensors
Author(s): Zaixuan Zhang; Shangzhong Jin; Honglin Liu; Insoo S. Kim; Jianfeng Wang; Xiaobiao Wu; Ning Guo; Tao Liu; Xiangdong Yu
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Paper Abstract

The backscattering spectrum of optical fiber has been measured by use 1427 nm Raman laser and Q8384 optical spectrum analyzer and Stokes and anti-Stokes ZX band backscattering spectrum has been first observed and discussed, ZX band frequency shift is 1THz, bandwidth 3THz(3dB). Optimum design of S-band negative dispersion DCF discrete fiber Raman amplifier has been researched by OPTIAMP DESIGN 3.3 SOFTWARE (made in Canada Optiwave Corporation) and gain spectrum and gain vs. power of DCF discrete fiber Raman amplifier have been measured, practical including Stokes ZX band backscattering gain effect. Pump on/off small signal gain is 13dB (pump power 700mw; fiber 5.1km) and gain band width is 88nm (1440nm-1528nm). The operation principle, configuration and performance of distributed fiber Raman temperature sensors system has been researched. Amplification of anti-Stokes spontaneity Raman scattering (ARS) effect of fiber and its temperature effect has been first observed and discussed. It has been applied to 30km distributed FRS system.

Paper Details

Date Published: 17 June 2003
PDF: 7 pages
Proc. SPIE 5129, Fundamental Problems of Optoelectronics and Microelectronics, (17 June 2003); doi: 10.1117/12.502264
Show Author Affiliations
Zaixuan Zhang, China Institute of Metrology (China)
Shangzhong Jin, China Institute of Metrology (China)
Honglin Liu, China Institute of Metrology (China)
Insoo S. Kim, Korea Electrotechnology Research Institute (South Korea)
Jianfeng Wang, China Institute of Metrology (China)
Xiaobiao Wu, China Institute of Metrology (China)
Ning Guo, China Institute of Metrology (China)
Tao Liu, China Institute of Metrology (China)
Xiangdong Yu, China Institute of Metrology (China)

Published in SPIE Proceedings Vol. 5129:
Fundamental Problems of Optoelectronics and Microelectronics
Yuri N. Kulchin; Oleg B. Vitrik, Editor(s)

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