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Proceedings Paper

High-power diode array reliability experiment
Author(s): David J. Gallant; John Boeckl
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Paper Abstract

Performance degradation and lifetimes of high power diode arrays are important issues for laser manufacturers and end users. To fully understand these issues long term testing and failure analysis of arrays is required. To perform this testing we have set up an automated lifetime experiment to examine the characteristics of high power arrays over time. Subsequent material analysis of the arrays will uncover failure mechanisms.

Paper Details

Date Published: 19 June 2003
PDF: 6 pages
Proc. SPIE 4973, High-Power Diode Laser Technology and Applications, (19 June 2003); doi: 10.1117/12.501865
Show Author Affiliations
David J. Gallant, Boeing Co. (United States)
John Boeckl, Air Force Research Lab. (United States)


Published in SPIE Proceedings Vol. 4973:
High-Power Diode Laser Technology and Applications
Mark S. Zediker, Editor(s)

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