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Proceedings Paper

Interferometric signal processing schemes for the measurement of strain
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Paper Abstract

In this paper we demonstrate the measurement of fiber strain for use in embedded sensor applications. Both of these methods utilize source frequency interrogation to monitor fiber strain. The first system described provides absolute strain information from a single-mode interferometric sensor used to measure absolute surface strain induced by deflection of a cantilever beam. The second system presented demonstrates remote interrogation of a lead insensitive two-mode elliptical core fiber sensor to measure relative changes in fiber strain.

Paper Details

Date Published: 1 December 1991
PDF: 8 pages
Proc. SPIE 1588, Fiber Optic Smart Structures and Skins IV, (1 December 1991); doi: 10.1117/12.50176
Show Author Affiliations
Timothy A. Berkoff, Naval Research Lab. (United States)
Alan D. Kersey, Naval Research Lab. (United States)


Published in SPIE Proceedings Vol. 1588:
Fiber Optic Smart Structures and Skins IV

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