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Proceedings Paper

Sapphire fiber interferometer for microdisplacement measurements at high temperatures
Author(s): Kent A. Murphy; Brian R. Fogg; George Z. Wang; Ashish M. Vengsarkar; Richard O. Claus
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Paper Abstract

We report the use of a short-length, multimode sapphire rod as an extension to a Michelson configuration, but operated as a low-finesse Fabry-Perot cavity. We demonstrate the performance of such a device as an interferometric sensor, where the interference between the reflections from the sapphire-air interface and an air-metallic surface is observed for microdisplacement of the metallic surface which is placed close to the sapphire endface. We describe in detail the fabrication procedure and present results obtained from the detection of temperature changes, applied strain, and surface acoustic waves.

Paper Details

Date Published: 1 December 1991
PDF: 8 pages
Proc. SPIE 1588, Fiber Optic Smart Structures and Skins IV, (1 December 1991); doi: 10.1117/12.50170
Show Author Affiliations
Kent A. Murphy, Virginia Polytechnic Institute and State Univ. (United States)
Brian R. Fogg, Virginia Polytechnic Institute and State Univ. (United States)
George Z. Wang, Virginia Polytechnic Institute and State Univ. (United States)
Ashish M. Vengsarkar, Virginia Polytechnic Institute and State Univ. (United States)
Richard O. Claus, Virginia Polytechnic Institute and State Univ. (United States)


Published in SPIE Proceedings Vol. 1588:
Fiber Optic Smart Structures and Skins IV

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