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Proceedings Paper

Spectroscan maks: compound analyzers
Author(s): Y. S. Kreknin; E. N. Majorova
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Paper Abstract

Analytical parameters of wavelength dispersive X-ray sequential bench top SPECTROSCAN-MAKS spectrometers for X-ray spectral fluorescent analysis were shown. It was shown that in spite of rather small size (all spectrometers are bench top ones) energy resolution and minimum value of determined concentrations the instruments are competitive with WDX spectrometers produced by other companies. Brief description of the software and developed analytical procedures for the instruments are given. Basic fields of applications are listed.

Paper Details

Date Published: 19 June 2003
PDF: 5 pages
Proc. SPIE 5066, Lasers for Measurements and Information Transfer 2002, (19 June 2003); doi: 10.1117/12.501690
Show Author Affiliations
Y. S. Kreknin, Spectron, Ltd. (Russia)
E. N. Majorova, Spectron, Ltd. (Russia)

Published in SPIE Proceedings Vol. 5066:
Lasers for Measurements and Information Transfer 2002
Vadim E. Privalov, Editor(s)

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