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Proceedings Paper

Spectral measurement of soft x-ray and EUV emissions from a laser-irradiated gas puff target using a transmission grating spectrometer
Author(s): Henryk Fiedorowicz; Andrzej Bartnik; Roman Jarocki; Jerzy Kostecki; Jacek Krzywinski; Janusz Mikolajczyk; Rafal Rakowski; Miroslaw Szczurek; Janusz Wawer
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Paper Abstract

Spectral measurements of a laser-produced soft x-ray and EUV source based on a double-stream gas puff target are described. The target was irradiated with a Nd:glass laser producing 1 ns pulses with energy up to 10 J. Production in the wavelength range up to 20 nm (x-ray and EUV emissions) have been measured from xenon, krypton, argon, and nitrogen targets using the transmission grating spectrometer with the back-illuminated CCD. Spectral characteristics of x-ray and EUV emissions are presented.

Paper Details

Date Published: 1 April 2003
PDF: 7 pages
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, (1 April 2003); doi: 10.1117/12.501394
Show Author Affiliations
Henryk Fiedorowicz, Military Univ. of Technology (Poland)
Andrzej Bartnik, Military Univ. of Technology (Poland)
Roman Jarocki, Military Univ. of Technology (Poland)
Jerzy Kostecki, Military Univ. of Technology (Poland)
Jacek Krzywinski, Institute of Physics (Poland)
Janusz Mikolajczyk, Military Univ. of Technology (Poland)
Rafal Rakowski, Military Univ. of Technology (Poland)
Miroslaw Szczurek, Military Univ. of Technology (Poland)
Janusz Wawer, Military Univ. of Technology (Poland)

Published in SPIE Proceedings Vol. 5064:
Lightmetry 2002: Metrology and Testing Techniques Using Light
Maksymilian Pluta; Mariusz Szyjer, Editor(s)

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