Share Email Print
cover

Proceedings Paper

Computer-aided photometric analysis of dynamic digital bioluminescent images
Author(s): Zbigniew Gorski; T. Bembnista; J. Floryszak-Wieczorek; Marek Domanski; Janusz Slawinski
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The paper deals with photometric and morphologic analysis of bioluminescent images obtained by registration of light radiated directly from some plant objects. Registration of images obtained from ultra-weak light sources by the single photon counting (SPC) technique is the subject of this work. The radiation is registered by use of a 16-bit charge coupled device (CCD) camera "Night Owl" together with WinLight EG&G Berthold software. Additional application-specific software has been developed in order to deal with objects that are changing during the exposition time. Advantages of the elaborated set of easy configurable tools named FCT for a computer-aided photometric and morphologic analysis of numerous series of quantitatively imperfect chemiluminescent images are described. Instructions are given how to use these tools and exemplified with several algorithms for the transformation of images library. Using the proposed FCT set, automatic photometric and morphologic analysis of the information hidden within series of chemiluminescent images reflecting defensive processes in poinsettia (Euphorbia pulcherrima Willd) leaves affected by a pathogenic fungus Botrytis cinerea is revealed.

Paper Details

Date Published: 1 April 2003
PDF: 10 pages
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, (1 April 2003); doi: 10.1117/12.501362
Show Author Affiliations
Zbigniew Gorski, Poznan Univ. of Technology (Poland)
T. Bembnista, Poznan Univ. of Technology (Poland)
J. Floryszak-Wieczorek, Agricultural Univ. of Poznan (Poland)
Marek Domanski, Poznan Univ. of Technology (Poland)
Janusz Slawinski, Poznan Univ. of Technology (Poland)


Published in SPIE Proceedings Vol. 5064:
Lightmetry 2002: Metrology and Testing Techniques Using Light
Maksymilian Pluta; Mariusz Szyjer, Editor(s)

© SPIE. Terms of Use
Back to Top