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Proceedings Paper

Large-format dual-broadband QWIP focal plane array imaging interferometers
Author(s): Sumith V. Bandara; Sarath D. Gunapala; Francis M. Reininger; J. K. Liu; Sir B. Rafol; Jason M. Mumolo; David Z. Y. Ting; Ricky W. Chuang; Thang Q. Trinh; J. M. Fastenau; A. W. K. Liu
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Paper Abstract

The Jet Propulsion Laboratory (JPL) is developing a 512x640-format, dual broadband, Quanum Well Infrared Photodetector (QWIP) focal plane array (FPA) for an imaging interferometer. This is a new type of imaging interferometer which is based on special Fourier-transform spectroscopy, scans interferograms digitally without moving any optical components. It is stable enough to measure fluctuating target signatures from unstable platforms, making it ideal for detecting chemical agents from a remotely piloted aircraft. These static interferometers require large-format FPAs with high uniformity and operability. QWIP technology is ideal for this instrument because it has achieved remarkable success in advancing highly uniform, highly-operability, and large-format multicolor FPAs. The FPA used in the interferometer covers the wavelength from 6-10 μm and 10-15 μm in alternative rows.

Paper Details

Date Published: 10 October 2003
PDF: 8 pages
Proc. SPIE 5074, Infrared Technology and Applications XXIX, (10 October 2003); doi: 10.1117/12.501278
Show Author Affiliations
Sumith V. Bandara, Jet Propulsion Lab. (United States)
Sarath D. Gunapala, Jet Propulsion Lab. (United States)
Francis M. Reininger, Jet Propulsion Lab. (United States)
J. K. Liu, Jet Propulsion Lab. (United States)
Sir B. Rafol, Jet Propulsion Lab. (United States)
Jason M. Mumolo, Jet Propulsion Lab. (United States)
David Z. Y. Ting, Jet Propulsion Lab. (United States)
Ricky W. Chuang, Jet Propulsion Lab. (United States)
Thang Q. Trinh, Jet Propulsion Lab. (United States)
J. M. Fastenau, IQE, Inc. (United States)
A. W. K. Liu, IQE, Inc. (United States)

Published in SPIE Proceedings Vol. 5074:
Infrared Technology and Applications XXIX
Bjorn F. Andresen; Gabor F. Fulop, Editor(s)

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