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Proceedings Paper

Imaging spectropolarimetry
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Paper Abstract

Spectrometry and polarimetry measurements are important to modern science and engineering in an extremely wide variety of fields such as atomic and chemical processes, materials identification and characterization, astronomy, remote sensing, and stress analysis. The basic principle is that when light is emitted or absorbed by, scattered or reflected from, or transmitted through a physical material, its spectral content and polarization state are often affected. Analysis of the changes imposed by these processes then has the potential to reveal useful information about the sources. Example applications are: (1) stress-induced birefringence (photoelasticity); (2) remote sensing, object discrimination, shape measurement; (3) communications (polarization shift keying, deterimental effects on fiber networks); (4) astronomy (solar magnetic fields); (5) scattering, materials identification (retinal nerve fiber layer thickness measurement); (6) ellipsometry (materials characterization, complex index of refraction, layer thicknesses); (7) atomic physics; (8) displays (color LCDs merge colorimetry and polarization).

Paper Details

Date Published: 10 October 2003
PDF: 14 pages
Proc. SPIE 5074, Infrared Technology and Applications XXIX, (10 October 2003); doi: 10.1117/12.501275
Show Author Affiliations
Eustace L. Dereniak, Optical Sciences Ctr., Univ. of Arizona (United States)
Nathan A. Hagen, Optical Sciences Ctr., Univ. of Arizona (United States)
William R. Johnson, Optical Sciences Ctr., Univ. of Arizona (United States)
Derek S. Sabatke, Optical Sciences Ctr., Univ. of Arizona (United States)
Ann M. Locke, Optical Sciences Ctr., Univ. of Arizona (United States)
Robert W. McMillan, U.S. Army Space and Missile Defense Command (United States)
Thomas K. Hamilton, U.S. Army Space and Missile Defense Command (United States)


Published in SPIE Proceedings Vol. 5074:
Infrared Technology and Applications XXIX
Bjorn F. Andresen; Gabor F. Fulop, Editor(s)

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