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Proceedings Paper

Challenges for third-generation cooled imagers
Author(s): Stuart Horn; Paul Norton; T. Cincotta; Andrew J. Stoltz; J. D. Benson; Philip Perconti; J. Campbell
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Paper Abstract

Third-Generation, two-color infrared cooled sensors are being developed in order to allow the Army to detect and identify enemy forces at ranges beyond that at which the enemy can detect them. This will ensure that the Army continues to "own" night operations. Developing the technology needed to field these high-performance third-generation cooled imagers poses many challenges to the infrared community. These devices, which are expected to provide high spatial and temporal resolution simultaneously in two-to-three infrared bands, will dramatically increase the ability to find targets in defilade, and will be a major technological breakthrough. Performance has to be close to the theoretical limit, dominated by the limits of photon noise. Cost is also a major factor if sufficient numbers of such sensors are to be fielded. The benefits of this technology are now described, followed by a summary of the challenges faced in meeting the cost and performance objectives.

Paper Details

Date Published: 10 October 2003
PDF: 8 pages
Proc. SPIE 5074, Infrared Technology and Applications XXIX, (10 October 2003); doi: 10.1117/12.501269
Show Author Affiliations
Stuart Horn, U.S. Army Night Vision & Electronic Sensors Directorate (United States)
Paul Norton, U.S. Army Night Vision & Electronic Sensors Directorate (United States)
T. Cincotta, U.S. Army Night Vision & Electronic Sensors Directorate (United States)
Andrew J. Stoltz, U.S. Army Night Vision & Electronic Sensors Directorate (United States)
J. D. Benson, U.S. Army Night Vision & Electronic Sensors Directorate (United States)
Philip Perconti, U.S. Army Night Vision & Electronic Sensors Directorate (United States)
J. Campbell, U.S. Army Night Vision & Electronic Sensors Directorate (United States)


Published in SPIE Proceedings Vol. 5074:
Infrared Technology and Applications XXIX
Bjorn F. Andresen; Gabor F. Fulop, Editor(s)

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