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Proceedings Paper

Time-of-flight laser scanner for architectural and archaeological applications
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Paper Abstract

The realization of an accurate 3D model of a building, a piece of architecture or a terrain has been a prerogative of the photogrammetric systems for a long time. However, recent developments in opto-electronic technology and 3D analysis software made the production of 3D models by laser scanning a practical proposition. The main advantages of laser scanners are accuracy and speed, allowing, thus, the collecting of data on a dense sampling of the object. For many architectural and industrial applications it is important to integrate the data acquired with different instruments, but a problem met with many commercial systems is the lack of compatibility with classic survey methodologies. Moreover, superimposition of results from different techniques is possible only if the output is metrically correct. This work is aimed at showing the results of some architectural and archaeological surveys realized by means of a 3D scanning device, based on the Time-Of-Flight (TOF) technology. The instrument, devoted to architectural applications in the Cultural Heritage field, was set up in order to provide the characteristics of reliability and compatibility to other systems. Such a device is composed by a high precision scanning system equipped with a commercial low-cost distance-meter.

Paper Details

Date Published: 9 October 2003
PDF: 9 pages
Proc. SPIE 5146, Optical Metrology for Arts and Multimedia, (9 October 2003); doi: 10.1117/12.501250
Show Author Affiliations
Raffaella Fontana, Istituto Nazionale di Ottica Applicata (Italy)
Maria Chiara Gambino, Istituto Nazionale di Ottica Applicata (Italy)
Gabriella G. Gianfrate, Univ. degli Studi di Lecce (Italy)
Marinella Greco, Istituto Nazionale di Ottica Applicata (Italy)
Luciano Marras, Istituto Nazionale di Ottica Applicata (Italy)
Marzia Materazzi, Istituto Nazionale di Ottica Applicata (Italy)
Enrico Pampaloni, Istituto Nazionale di Ottica Applicata (Italy)
Luca Pezzati, Istituto Nazionale di Ottica Applicata (Italy)

Published in SPIE Proceedings Vol. 5146:
Optical Metrology for Arts and Multimedia
Renzo Salimbeni, Editor(s)

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