Share Email Print
cover

Proceedings Paper

Development of an autonomous scanning laser Doppler vibrometer vibration tracking method for inline quality control
Author(s): Steve Vanlanduit; Bart Cauberghe; Patrick Guillaume; Peter Verboven
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Optical measurement techniques are being used more and more for quality control in the production process. An important problem when trying to implement optical measurement systems, and in particular the scanning laser Doppler vibrometer (SLDV) which is considered in this paper, is that user interaction is always required. The need for user interaction implies an increase in testing time and cost and also brings an additional source of variability of the test results. In this article, a completely autonomous test procedure is developed to track the vibration behavior of a product during the production process (this includes automatic laser focusing, position calibration, object recognition, grid generation and mode estimation). The proposed procedure typically requires a few minutes only to automatically determine a high resolution model of the vibration behavior. The method will be validated on measurements of an electronic circuit board.

Paper Details

Date Published: 30 May 2003
PDF: 8 pages
Proc. SPIE 5144, Optical Measurement Systems for Industrial Inspection III, (30 May 2003); doi: 10.1117/12.501236
Show Author Affiliations
Steve Vanlanduit, Vrije Univ. Brussel (Belgium)
TechPro Engineering (Belgium)
Bart Cauberghe, Vrije Univ. Brussel (Belgium)
TechPro Engineering (Belgium)
Patrick Guillaume, Vrije Univ. Brussel (Belgium)
Peter Verboven, Vrije Univ. Brussel (Belgium)
TechPro Engineering (Belgium)


Published in SPIE Proceedings Vol. 5144:
Optical Measurement Systems for Industrial Inspection III
Wolfgang Osten; Malgorzata Kujawinska; Katherine Creath, Editor(s)

© SPIE. Terms of Use
Back to Top