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Proceedings Paper

Real-time IR/EO scene simulator (RISS) product improvements
Author(s): Douglas C. McKee; Onda D. Simmons; Robert J. Makar; Mark E. Nuwer; Paul W. Palumbo; Paul G. Schlossman; Roderic C. Perry; Louis Chan
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Paper Abstract

Northrop Grumman Amherst Systems has continued to improve the Real-time IR/EO Scene Simulator (RISS) for hardware-in-the-loop (HWIL) testing of infrared sensor systems. Several new and enhanced capabilities have been added to the system for both customer and internal development programs. A new external control capability provides control of either player trajectories or unit-under-test (UUT) orientation. The RISS Scene Rendering Subsystem (SRS) has been enhanced with support for texture transparency and increased texture memory capacity. The RISS Universal Programmable Interface (UPI) graphical user interface (GUI) has been improved to provide added flexibility and control of the real-time sensor modeling capabilities. This paper will further explore these and other product improvements.

Paper Details

Date Published: 12 September 2003
PDF: 9 pages
Proc. SPIE 5092, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VIII, (12 September 2003); doi: 10.1117/12.501200
Show Author Affiliations
Douglas C. McKee, Northrop Grumman Amherst Systems (United States)
Onda D. Simmons, Northrop Grumman Amherst Systems (United States)
Robert J. Makar, Northrop Grumman Amherst Systems (United States)
Mark E. Nuwer, Northrop Grumman Amherst Systems (United States)
Paul W. Palumbo, Northrop Grumman Amherst Systems (United States)
Paul G. Schlossman, Northrop Grumman Amherst Systems (United States)
Roderic C. Perry, Air Force Research Lab. (United States)
Louis Chan, Air Force Research Lab. (United States)


Published in SPIE Proceedings Vol. 5092:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VIII
Robert Lee Murrer, Editor(s)

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