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Proceedings Paper

Compensation of temporal and spatial dispersion for multiphoton acousto-optic laser-scanning microscopy
Author(s): Vijay Iyer; Peter Saggau
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Paper Abstract

In laser-scanning microscopy, acousto-optic (AO) deflection provides a means to quickly position a laser beam to random locations throughout the field-of-view. Compared to conventional laser-scanning using galvanometer-driven mirrors, this approach increases the frame rate and signal-to-noise ratio, and reduces time spent illuminating sites of no interest. However, random-access AO scanning has not yet been combined with multi-photon microscopy, primarily because the femtosecond laser pulses employed are subject to significant amounts of both spatial and temporal dispersion upon propagation through common AO materials. Left uncompensated, spatial dispersion reduces the microscope’s spatial resolution while temporal dispersion reduces the multi-photon excitation efficacy. In previous work, we have demonstrated, 1) the efficacy of a single diffraction grating scheme which reduces the spatial dispersion at least 3-fold throughout the field-of-view, and 2) the use of a novel stacked-prism pre-chirper for compensating the temporal dispersion of a pair of AODs using a shorter mechanical path length (2-4X) than standard prism-pair arrangements. In this work, we demonstrate for the first time the use of these compensation approaches with a custom-made large-area slow-shear TeO2 AOD specifically suited for the development of a high-resolution 2-D random-access AO scanning multi-photon laser-scanning microscope (AO-MPLSM).

Paper Details

Date Published: 9 October 2003
PDF: 13 pages
Proc. SPIE 5139, Confocal, Multiphoton, and Nonlinear Microscopic Imaging, (9 October 2003); doi: 10.1117/12.500857
Show Author Affiliations
Vijay Iyer, Rice Univ. (United States)
Baylor College of Medicine (United States)
Peter Saggau, Baylor College of Medicine (United States)
Rice Univ. (United States)

Published in SPIE Proceedings Vol. 5139:
Confocal, Multiphoton, and Nonlinear Microscopic Imaging
Tony Wilson, Editor(s)

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